Detection of wafers

When producing wafers, the individual layers must be correctly positioned for further processing. Depending on the layer, the wafers have different, sometimes high-gloss surfaces. Thanks to the TwinEye-Technology® and high grayscale resolution, KTS and KTX  detection of all different types of wafer surfaces is not only reliable, but teach-in is also quick and easy.

Product: KTS and KTX family of contrast sensors

This is an application from SICK.
Tri-Phase Automation is a SICK distributor in Wisconsin.
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